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Subatomic electronic feature from dynamic motion of Si dimer defects in Bi nanolines on Si(001)

Published on August 7, 2017

Reduced dimensions can give rise to surprising effects. While a long exposure time photograph of a macroscopic moving object appears blurred, scanning tunneling microscopy images of flipping Si dimer defects embedded in Bi-nanolines on the Si(001) surface appear much sharper than those of static ones. This counter intuitive dynamic sharpening is perfectly modelled by density functional theory.


C. J. Kirkham, M. Longobardi, S. A. Köster, Ch. Renner, and D. R. Bowler

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